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[IEEE 2009 WRI World Congress on Computer Science and Information Engineering - Los Angeles, California USA (2009.03.31-2009.04.2)] 2009 WRI World Congress on Computer Science and Information Engineering - Using the Number of Faults to Improve Fault-Proneness Prediction of the Probability Models
Li, Lianfa, Leung, HaretonYear:
2009
Language:
english
DOI:
10.1109/csie.2009.349
File:
PDF, 379 KB
english, 2009