[IEEE 2009 WRI World Congress on Computer Science and...

  • Main
  • [IEEE 2009 WRI World Congress on...

[IEEE 2009 WRI World Congress on Computer Science and Information Engineering - Los Angeles, California USA (2009.03.31-2009.04.2)] 2009 WRI World Congress on Computer Science and Information Engineering - Using the Number of Faults to Improve Fault-Proneness Prediction of the Probability Models

Li, Lianfa, Leung, Hareton
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/csie.2009.349
File:
PDF, 379 KB
english, 2009
Conversion to is in progress
Conversion to is failed