![](/img/cover-not-exists.png)
[Electron. Ind. Assoc 1997 GaAs Reliability Workshop. Proceedings - Anaheim, CA, USA (12 Oct. 1997)] 1997 GaAs Reliability Workshop. Proceedings - Comparison of statistical distributions for the analysis of GaAs MMIC life test data
Mittereder, J.A., Roussos, J.R., Karanikolas, M.T., Anderson, W.T.Year:
1997
Language:
english
DOI:
10.1109/gaasrw.1997.656122
File:
PDF, 493 KB
english, 1997