[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - A Predictable Robust Fully Programmable Analog Gaussian Noise Source for Mixed-Signal/Digital ATE
Aouini, Sadok, Roberts, GordonYear:
2006
Language:
english
DOI:
10.1109/test.2006.297677
File:
PDF, 631 KB
english, 2006