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[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Classification by bagged consistent itemset rules
Shidara, Yohji, Kudo, Mineichi, Nakamura, AtsuyoshiYear:
2008
Language:
english
DOI:
10.1109/icpr.2008.4761082
File:
PDF, 806 KB
english, 2008