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[IEEE 2010 IEEE International SOC Conference (SOCC) - Las Vegas, NV, USA (2010.09.27-2010.09.29)] 23rd IEEE International SOC Conference - Process technology and design parameter impact on SRAM Bit-Cell Sleep effectiveness
Shamanna, Guru, Kshatri, B.S., Gaurav, R., Tew, Y.S., Marfatia, P., Raghavendra, Y., Naik, V.Year:
2010
Language:
english
DOI:
10.1109/socc.2010.5784653
File:
PDF, 1.50 MB
english, 2010