[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Experience with biased random pattern generation to meet the demand for a high quality BIST
Gruetzner, M., Starke, C.W.Année:
1993
Langue:
english
DOI:
10.1109/etc.1993.246584
Fichier:
PDF, 667 KB
english, 1993