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[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - The role of the temperature on the scattering mechanisms limiting the electron mobility in metal-oxide-semiconductor field-effect-transistors fabricated on (110) silicon-oriented wafers
Gaubert, Philippe, Teramoto, Akinobu, Sugawa, Shigetoshi, Ohmi, TadahiroYear:
2012
Language:
english
DOI:
10.1109/essderc.2012.6343371
File:
PDF, 1.20 MB
english, 2012