[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - A Bayesian-based process parameter estimation using IDDQ current signature
Shintani, Michihiro, Sato, TakashiYear:
2012
Language:
english
DOI:
10.1109/vts.2012.6231085
File:
PDF, 845 KB
english, 2012