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[IEEE 2008 International Semiconductor Conference - Sinaia, Romania (2008.10.13-2008.10.15)] 2008 International Semiconductor Conference - C-V parameter extraction technique for characterisation the diffused junctions of semiconductor devices
Cristea, Miron J., Babarada, FlorinYear:
2008
Language:
english
DOI:
10.1109/smicnd.2008.4703419
File:
PDF, 140 KB
english, 2008