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[IEEE 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) - Hakone-Machi, Kanagawa (2008.09.9-2008.09.11)] 2008 International Conference on Simulation of Semiconductor Processes and Devices - Reduction of discrete-dopant-induced high-frequency characteristic fluctuations in nanoscale CMOS circuit
Yiming Li,, Chih-Hong Hwang,, Ta-Ching Yeh,, Hsuan-Ming Huang,, Tien-Yeh Li,, Hui-Wen Cheng,Year:
2008
Language:
english
DOI:
10.1109/sispad.2008.4648274
File:
PDF, 1.12 MB
english, 2008