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[IEEE 2010 33rd International Spring Seminar on Electronics Technology (ISSE) - Warsaw, Poland (2010.05.12-2010.05.16)] 33rd International Spring Seminar on Electronics Technology, ISSE 2010 - Influence of metallographic preparation on electron backscatter diffraction characterization of copper wire bonds
Tkachenko, Anton, Mueller, Maik, Zerna, Thomas, Wolter, Klaus-JuergenYear:
2010
Language:
english
DOI:
10.1109/isse.2010.5547258
File:
PDF, 564 KB
english, 2010