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[IEEE 2013 7th IEEE GCC Conference and Exhibition (GCC) - Doha, Qatar (2013.11.17-2013.11.20)] 2013 7th IEEE GCC Conference and Exhibition (GCC) - Modelling of high voltage SF6 circuit breaker reliability based on Bayesian statistics
Muratovic, Mahir, Sokolija, Kemo, Kapetanovic, MirsadYear:
2013
Language:
english
DOI:
10.1109/ieeegcc.2013.6705794
File:
PDF, 617 KB
english, 2013