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[IEEE amp; Failure Analysis of Integrated Circuits, IPFA 2007 - Bangalore (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Trends in memory technology - reliability perspectives, challenges and opportunities
Mouli, C., Prall, K., Roberts, C.Year:
2007
Language:
english
DOI:
10.1109/ipfa.2007.4378072
File:
PDF, 5.14 MB
english, 2007