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[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - Intrinsic fluctuations in Vertical NAND flash memories
Nowak, Etienne, Kim, Jae-Ho, Kwon, HyeYoung, Kim, Young-Gu, Sim, Jae Sung, Lim, Seung-Hyun, Kim, Dae Sin, Lee, Keun-Ho, Park, Young-Kwan, Choi, Jeong-Hyuk, Chung, ChilheeYear:
2012
Language:
english
DOI:
10.1109/vlsit.2012.6242441
File:
PDF, 412 KB
english, 2012