Estimation and verification of radiation induced N/sub ot/...

IEEE Transactions on Nuclear Science 2005 / 12 Vol. 52; Iss. 6

Estimation and verification of radiation induced N/sub ot/ and N/sub it/ energy distribution using combined bipolar and MOS characterization methods in gated bipolar devices

Chen, X.J., Barnaby, H.J., Pease, R.L., Schrimpf, R.D., Platteter, D., Shaneyfelt, M., Vermeire, B.
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Volume:
52
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2005.860669
Date:
December, 2005
File:
PDF, 321 KB
english, 2005
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