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[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - A viable and comprehensive TDDB assessment methodology for investigation of SRAM Vmin failure

Wu, E., Braceras, G., Turner, D., Swift, A., Johnson, M., Sune, J., Tous, S., Li, B., Bolam, R., Massey, G., Khare, M.
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Year:
2009
Language:
english
DOI:
10.1109/iedm.2009.5424340
File:
PDF, 279 KB
english, 2009
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