[IEEE 2007 International Conference on Thermal Issues in...

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[IEEE 2007 International Conference on Thermal Issues in Emerging Technologies: Theory and Application - Cairo (2007.01.3-2007.01.6)] 2007 International Conference on Thermal Issues in Emerging Technologies: Theory and Application - Thermopower Profiling Across a Silicon P-N Junction Through the 2ω Signal Measurement of AC Current-Heated Tip-Sample Nano-Contact

Kyeongtae Kim,, Jisang Park,, Sun Ung Kim,, Ohmyoung Kwon,, Joon Sik Lee,, Seung Ho Park,, Young Ki Choi,
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Year:
2007
Language:
english
DOI:
10.1109/theta.2007.363437
File:
PDF, 284 KB
english, 2007
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