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[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Experimental characterization of source-to-drain tunneling in 10nm SOI devices
Lolivier, J., Rafhay, Q., Poiroux, T., Vinet, M., Previtali, B., Deleonibus, S., Jehl, X., Sanquer, M., Balestra, F.Year:
2005
Language:
english
DOI:
10.1109/soi.2005.1563525
File:
PDF, 693 KB
english, 2005