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[IEEE 2012 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Tunis, Tunisia (2012.05.16-2012.05.18)] 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Failure analysis of hot-electron effect on power RF N-LDMOS transistors
Belaid, M. A., Gares, M., Daoud, K., Eudeline, Ph.Year:
2012
Language:
english
DOI:
10.1109/dtis.2012.6232981
File:
PDF, 424 KB
english, 2012