[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Review on induced CDM-ESD test methodologies for flash memory device
Law Che Seong,, Yeoh Lai Seng,, Edumban, Kaneasan, Lee Meng Chuan,, Steven Fan Choo Kean,Year:
2011
Language:
english
DOI:
10.1109/ipfa.2011.5992714
File:
PDF, 886 KB
english, 2011