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[IEEE 19th Design Automation Conference - Las Vegas, NV, USA (1982.06.14-1982.06.16)] 19th Design Automation Conference - Testing Functional Faults in VLSI
Yinghua Min,, Su, S.Y.H.Year:
1982
Language:
english
DOI:
10.1109/dac.1982.1585528
File:
PDF, 671 KB
english, 1982