Study of neutron damage in GaAs MESFETs

IEEE Transactions on Nuclear Science 1997 / 6 Vol. 44; Iss. 3

Study of neutron damage in GaAs MESFETs

Meneghesso, G., Paccagnella, A., Camin, D.V., Fedyakin, N., Pessina, G., Canali, C.
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Volume:
44
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.603762
Date:
June, 1997
File:
PDF, 768 KB
english, 1997
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