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[IEEE 2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace - Anaheim, CA, USA (18-21 Sept. 2000)] 2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) - Test vector compression via statistical coding and dynamic compaction
Mom Eng Ng,, Touba, N.A.Year:
2000
Language:
english
DOI:
10.1109/autest.2000.885613
File:
PDF, 520 KB
english, 2000