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[IEEE IEEE International Conference on Microelectronic Test Structures - Long Beach, CA (February 22-23, 1988)] Proceedings of the IEEE International Conference on Microelectronic Test Structures - Total Dose Radiation Respnse Of Test Structures And VLSI Lcqic Devices: An Analytical And Experimental Correlation
Newberry, D.M., Peters, B.E.Year:
1988
Language:
english
DOI:
10.1109/icmts.1988.672930
File:
PDF, 602 KB
english, 1988