[IEEE VIS 05. IEEE Visualization, 2005. - Minneapolis, MN, USA (Oct. 23-28, 2005)] VIS 05. IEEE Visualization, 2005. - Extracting Higher Order Critical Points and Topological Simplification of 3D Vector Fields
Weinkauf, T., Theisel, H., Kuangyu Shi,, Hege, H.-C., Seidel, H.-P.Year:
2005
Language:
english
DOI:
10.1109/visual.2005.1532842
File:
PDF, 2.70 MB
english, 2005