Single-event transient (SET) characterization of an LM119...

IEEE Transactions on Nuclear Science 2002 / 06 Vol. 49; Iss. 3

Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

Buchner, S., McMorrow, D., Sternberg, A., Massengill, L., Pease, R.L., Maher, M.
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Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.1039691
Date:
June, 2002
File:
PDF, 260 KB
english, 2002
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