[IEEE 2007 International Symposium on Integrated Circuits - Singapore (2007.09.26-2007.09.28)] 2007 International Symposium on Integrated Circuits - Yield Predictive Model Characterization In Analog Circuit Design
Ali, Sawal Hamid Md, Wilson, Peter R., Brown, Andrew D.Year:
2007
Language:
english
DOI:
10.1109/isicir.2007.4441855
File:
PDF, 2.83 MB
english, 2007