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[IEEE 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2011.04.25-2011.04.27)] Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications - FDSOI radiation dosimeters
Yau, Jeng-Bang, Gordon, Michael S., Rodbell, Kenneth P., Koester, Steven J., DeHaven, Patrick W., Park, Dae-Gyu, Haensch, Wilfried E.Year:
2011
Language:
english
DOI:
10.1109/vtsa.2011.5872260
File:
PDF, 346 KB
english, 2011