[IEEE 2008 19th International Conference on Pattern...

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[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Variance estimation for two-class and multi-class ROC analysis using operating point averaging

Paclik, Pavel, Lai, Carmen, Novovicova, Jana, Duin, Robert P.W.
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Year:
2008
Language:
english
DOI:
10.1109/icpr.2008.4761092
File:
PDF, 239 KB
english, 2008
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