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[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Characterization and compensation of performance variability using on-chip monitors
Islam, A.K.M. Mahfuzul, Onodera, HidetoshiYear:
2014
Language:
english
DOI:
10.1109/vlsi-tsa.2014.6839640
File:
PDF, 634 KB
english, 2014