Influence of Stress-Induced Leakage Current on Reliability...

IEEE Transactions on Device and Materials Reliability 2007 / 06 Vol. 7; Iss. 2

Influence of Stress-Induced Leakage Current on Reliability of $\hbox{HfSiO}_{x}$

Jakschik, Stefan, Kauerauf, Thomas, Degraeve, R., Hwang, Y. N., Duschl, Rainer, Kerber, Martin, Avellan, Alejandro, Kudelka, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
7
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2007.902201
Date:
June, 2007
File:
PDF, 444 KB
english, 2007
Conversion to is in progress
Conversion to is failed