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[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits
Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, ArturYear:
2010
Language:
english
DOI:
10.1109/delta.2010.32
File:
PDF, 344 KB
english, 2010