[IEEE 2014 72nd Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2014.6.22-2014.6.25)] 72nd Device Research Conference - Influence of InP source/drain layers upon the DC characteristics of InAs/InGaAs MOSFETs
Huang, Cheng-Ying, Lee, Sanghoon, Elias, Doron C., Law, Jeremy J. M., Chobpattana, Varistha, Stemmer, Susanne, Gossard, Arthur C., Rodwell, Mark J. W.Year:
2014
Language:
english
DOI:
10.1109/drc.2014.6872379
File:
PDF, 217 KB
english, 2014