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Carrier removal by implanted IONS in GaAs
Gecim, H. S., Sealy, B. J., Stephens, K. G., Ono, Y.Volume:
49
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337578008243088
Date:
January, 1980
File:
PDF, 298 KB
english, 1980