[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Understanding the impact of metal gate on TANOS performance and retention
Van den bosch, G., Arreghini, A., Breuil, L., Cacciato, A., Schram, T., Suhane, A., Zahid, M. B., Jurczak, M., Van Houdt, J.Year:
2010
Language:
english
DOI:
10.1109/imw.2010.5488385
File:
PDF, 302 KB
english, 2010