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[IEEE Comput. Soc. Press First Asian Test Symposium (ATS `92) - Hiroshima, Japan (26-27 Nov. 1992)] Proceedings First Asian Test Symposium (ATS `92) - Techniques for reducing hardware requirement of self checking combinational circuits
Pagey, S., Sherlekar, S.D., Venkatesh, G.Year:
1992
Language:
english
DOI:
10.1109/ats.1992.224419
File:
PDF, 528 KB
english, 1992