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[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - Enhanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique
Bi, Yu, de Graaf, Simon, van der Meijs, NickYear:
2011
Language:
english
DOI:
10.1109/cicc.2011.6055331
File:
PDF, 632 KB
english, 2011