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[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - Process variations in sub-threshold SRAM cells in 65nm CMOS

Moradi, Farshad, Wisland, Dag, Berg, Yngvar, Aunet, Snorre, Tuan Vu Cao,
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Year:
2010
Language:
english
DOI:
10.1109/icm.2010.5696164
File:
PDF, 1.47 MB
english, 2010
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