[IEEE 2012 3rd International Workshop on Product LinE...

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[IEEE 2012 3rd International Workshop on Product LinE Approaches in Software Engineering (PLEASE) - Zurich, Switzerland (2012.06.4-2012.06.4)] 2012 Third International Workshop on Product LinE Approaches in Software Engineering (PLEASE) - Feature-analysis-based selection method for system configuration for system testing

Shimbara, Daisuke, Watanabe, Hiroyuki, Kakushi, Shinichi, Kawakami, Masumi, Ogawa, Hideto
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Year:
2012
Language:
english
DOI:
10.1109/please.2012.6229775
File:
PDF, 372 KB
english, 2012
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