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[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Test structures for characterization of thermal-mechanical stress in 3D stacked IC for analog design
Minas, Nikolaos, Van der Plas, Geert, Oprins, Herman, Yang, Yu, Okoro, Chuckwudi, Mercha, Abdelkarim, Cherman, Vladimir, Torregiani, Cristina, Perry, Dan, Cupac, Miro, Rakowski, Michal, Marchal, PolYear:
2010
Language:
english
DOI:
10.1109/icmts.2010.5466836
File:
PDF, 4.13 MB
english, 2010