[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - Experimental results of forward-looking reverse order fault simulation on industrial circuits with scan
Pomeranz, I., Reddy, S.M., Xijiang Lin,Year:
2001
Language:
english
DOI:
10.1109/ats.2001.990334
File:
PDF, 139 KB
english, 2001