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[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Ultra high precision circuit diagnosis through seebeck generation and charge monitoring
Boit, Christian, Helfmeier, Clemens, Nedospasov, Dmitry, Fox, AlexanderYear:
2013
Language:
english
DOI:
10.1109/ipfa.2013.6599119
File:
PDF, 514 KB
english, 2013