Off-State Stress Degradation Analysis and Optimization for...

IEEE Transactions on Electron Devices 2013 / 11 Vol. 60; Iss. 11

Off-State Stress Degradation Analysis and Optimization for the High-Voltage SOI-pLEDMOS With Thick Gate Oxide

Liu, Siyang, Sun, Weifeng, Zhu, Rongxia, Huang, Tingting, Zhang, Chunwei
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2280290
Date:
November, 2013
File:
PDF, 2.26 MB
english, 2013
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