[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Optimal frequency selection algorithm for ADC frequency domain dynamic tests
Ong, Meng Sang, Kuang, Ye Chow, Ooi, Melanie Po-leen, Demidenko, Serge, Soo, Kui Ting, David, HomerYear:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488173
File:
PDF, 641 KB
english, 2010