Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product
Stapper, C. H., McLaren, A. N., Dreckmann, M.Volume:
24
Language:
english
Journal:
IBM Journal of Research and Development
DOI:
10.1147/rd.243.0398
Date:
May, 1980
File:
PDF, 846 KB
english, 1980