[IEEE 2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement (SSIRI) - Shanghai, China (2009.07.8-2009.07.10)] 2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement - A New Method to Model and Analyze the WS-BPEL Process under the Dead-Path-Elimination Semantics
Xu, Chunxiang, Wang, Hanpin, Qu, Wanling, Zhu, Meixia, Huang, YuYear:
2009
Language:
english
DOI:
10.1109/ssiri.2009.37
File:
PDF, 763 KB
english, 2009