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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Influence of back-gate bias and process conditions on the gamma-degradation of the transconductance of MuGFETs
Put, S., Simoen, E., Collaert, N., De Keersgieter, A., Claeys, C., Van Uffelen, M., Leroux, P.Year:
2009
Language:
english
DOI:
10.1109/radecs.2009.5994545
File:
PDF, 2.27 MB
english, 2009