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[IEEE ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings - Pusan, South Korea (12-16 June 2001)] ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings (Cat. No.01TH8570) - Dynamic measurement based on image analysis
Tae Hoon Lee,, Sung Ki Ha,, Hyo Moon Lee,, Kang Sup Yoon,, Nam Su Hur,, Jong II Bae,, You Duck Park,, Man Hyung Lee,Volume:
3
Year:
2001
Language:
english
DOI:
10.1109/isie.2001.931921
File:
PDF, 375 KB
english, 2001