[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - Impact of buried oxide thickness and ground plane resistivity on substrate cross-talk in ground plane silicon-on-insulator (GPSOI) cross-talk suppression technology
Stefanou, S., Hamel, J.S., Baine, P., Bain, M., Armstrong, B.M., Gamble, H.S., Kraft, M., Kemhadjian, H.A.Year:
2004
Language:
english
DOI:
10.1109/soi.2004.1391566
File:
PDF, 161 KB
english, 2004