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[IEEE 2009 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Boise, Idaho, USA (2009.04.3-2009.04.3)] 2009 IEEE Workshop on Microelectronics and Electron Devices - Resistive Memory Sensing Using Delta-Sigma Modulation
Rapole, H., Rajagiri, A., Balasubramanian, M., Campbell, K. A., Baker, R. J.Year:
2009
Language:
english
DOI:
10.1109/wmed.2009.4816149
File:
PDF, 295 KB
english, 2009